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USER MANUAL SY89847U Microchip
1.5 GHz Precision LVDS 1:5 Fanout with 2:1 MUX and Fail Safe Input with Internal Termination
Features
- Selects Between Two Sources and Provides 5 Precision LVDS Copies
- Fail Safe Input Prevents Outputs from Oscillating when Input is Invalid
- Guaranteed AC Performance over Temperature and Supply Voltage:
- DC-to >1.5 GHz Throughput
- <1000 ps Propagation Delay (IN-to-Q)
- <210 ps Rise/Fall Times
- Ultra-Low Jitter Design:
- < 1 RM\$ Random Jitter
- < 1 RMS Cycle-to-Cycle Jitter
- < 1 0pp Total Jitter (Clock)
- < 0 . RMB MUX Crosstalk Induced Jitter
- Unique, Patented MUX Input Isolation Design Minimizes Adjacent Channel Crosstalk
- Unique, Patented Internal Termination and V_T Pin Accepts DC- and AC-Coupled Inputs (CML, PECL, LVDS)
- Wide Input Voltage Range V_CC to GND
• 2.5V ±5% Supply Voltage
- - 40^ C to + 85^ C Industrial Temperature Range
• Available in 32-Pin (5 mm x 5 mm) QFN Package
Applications
- Fail Safe Clock Protection
• Ultra-Low Jitter LVDS Clock Distribution
• Rack-Based Telecom/Datacom
Markets
• LAN/WAN
- Enterprise Servers
- ATE
• Test and Measurement
General Description
The SY89847U is a 2.5V, 1:5 LVDS fanout buffer with a 2:1 differential input multiplexer (MUX). A unique fail safe input (FSI) protection prevents metastable output conditions when the selected input clock fails to a DC voltage (voltage between the pins of the differential input drops significantly below 100 mV).
The differential input includes Microchip's unique, 3-pin internal termination architecture that can interface to any differential signal (AC- or DC-coupled) as small as 100 mV (200 mV) without any level shifting or termination resistor networks in the signal path. The outputs are LVDS compatible with very fast rise/fall times guaranteed to be less than 210 ps.
The SY89847U operates from a 2.5V ±5% supply and is guaranteed over the full industrial temperature range of -40°C to +85°C. The SY89847U is part of Microchip's high-speed, Precision Edge® product line.
Package Type

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SY89847U 5 mm x 5 mm QFN-32 (M) (Top View) VREF-AC0 GND GND VCC VCC Q0 /Q0 VCC 32 31 30 29 28 27 26 25 VT0 1 IN0 2 /IN0 3 OE 4 SEL 5 IN1 6 /IN1 7 VT1 8 VREF-AC1 GND GND VCC VCC /Q4 Q4 VCC 24 23 22 21 20 19 18 17 1 5 1 4 1 3 1 2 1 1 1 0 1 1 1 2 1 3 1 4 Q1 /Q1 VCC Q2 /Q2 VCC Q3 /Q3Functional Block Diagram

flowchart
graph TD
IN0["IN0"] -->|50Ω| NOT1["NOT"]
V_T0["V_T0"] -->|50Ω| NOT2["NOT"]
/IN0["/IN0"] -->|50Ω| NOT3["NOT"]
V_REF_AC0["V_REF_AC0"] -->|50Ω| NOT4["NOT"]
IN1["IN1"] -->|50Ω| NOT5["NOT"]
V_T1["V_T1"] -->|50Ω| NOT6["NOT"]
/IN1["/IN1"] -->|50Ω| NOT7["NOT"]
V_REF_AC1["V_REF_AC1"] -->|50Ω| NOT8["NOT"]
NOT1 --> SEL["SEL"]
NOT2 --> SEL
NOT3 --> SEL
NOT4 --> SEL
NOT5 --> SEL
NOT6 --> SEL
NOT7 --> SEL
NOT8 --> SEL
SEL --> OE["OE"]
OE --> EnableLogic["Enable Logic"]
EnableLogic --> Q0["Q0"]
EnableLogic --> Q1["Q1"]
EnableLogic --> Q2["Q2"]
EnableLogic --> Q3["Q3"]
EnableLogic --> Q4["Q4"]
1.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings †
Supply Voltage ( V_CC )....-0.5V to +4.0V
Input Voltage ( V_IN ) -0.5V to V_CC
LVPECL Output Current ( I_OUT ) Continuous....50 mA Surge....100 mA
Current ( V_T ) Source or Sink on V_T Pin....±100 mA
Input Current Source or Sink Current on IN, /IN ....±50 mA
Current (VREF) Source or Sink Current on VREF-AC (Note 1).... ±0.5 mA
Operating Ratings ††
Supply Voltage ( V_CC )....+2.375V to +2.625V
† Notice: Permanent device damage may occur if absolute maximum ratings are exceeded. This is a stress rating only and functional operation is not implied at conditions other than those detailed in the operational sections of this data sheet. Exposure to absolute maximum ratings conditions for extended periods may affect device reliability.
†† Notice: The data sheet limits are not guaranteed if the device is operated beyond the operating ratings.
Note 1: Due to the limited drive capability, use for input of the same package only.
DC ELECTRICAL CHARACTERISTICS (Note 1)
Electrical Characteristics: T_A = -40^ to +85^ , unless otherwise stated.
| Parameters Sym. | Min. Typ. | Max. Units Conditions | ||||
| Power Supply V | CC | 2.375 2.5 | 2.625 V — | |||
| Power Supply Current I | CC | — 90 | 130 mA No load, max. V | cc | ||
| Input Resistance (IN-to-VT) | RIN | 45 | 50 | 55 | Ω | — |
| Differential Input Resistance (IN-to-/IN) | RDIFF_IN | 90 | 100 | 110 | Ω | — |
| Input High Voltage (IN, /IN) | VIH | 0.1 | — | VCC | V | — |
| Input Low Voltage (IN, /IN) | VIL | 0 | — | VIH-0.1 | V — | |
| Input Voltage Swing (IN, /IN) | VIN | 0.1 | — | 1.0 | V | Note 2, See Figure 5-6 |
| Different Input Voltage Swing |IN, /IN| | VDIFF_IN | 0.2 | — | 2.0 | V | See Figure 5-7 |
| Input Voltage Threshold that Triggers FSI | VIN_FSI | — 30 | 100 mV — | |||
| Output Reference Voltage | VREF-AC | VCC-1.3 | VCC-1.2 | VCC-1.1 | VI | VREF-AC = ±0.5 mA |
| Voltage from Input to VT | VT_IN | — | — | 1.28 | V — | |
Note 1: The circuit is designed to meet the DC specifications shown in the above table after thermal equilibrium has been established.
2: V_IN(MAX) is specified when V_T is floating.
LVDS OUTPUTS DC ELECTRICAL CHARACTERISTICS (Note 1)
Electrical Characteristics: V_CC = +2.5V ± 5% , R_L = 100 across the outputs; T_A = -40^ to +85^ , unless otherwise stated.
| Parameter | Symbol | Min. | Typ. | Max. | Units | Condition |
| Output Voltage Swing (Q, /Q) | V_OUT | 250 | 325 | — | mV | See Figure 5-6 |
| Differential Output Voltage Swing |Q, /Q| | V_DIFF\_OUT | 500 | 650 | — | mV | See Figure 5-7 |
| Output Common Mode Voltage (Q, /Q) | V_OCM | 1.125 | 1.20 | 1.275 | V | See Figure 7-1 |
| Change in Common Mode Voltage (Q, /Q) | V_OCM | -50 | — | 50 | mV | See Figure 7-2 |
Note 1: The circuit is designed to meet the DC specifications shown in the above table after thermal equilibrium has been established.
LVTTL/CMOS DC ELECTRICAL CHARACTERISTICS (Note 1)
Electrical Characteristics: V_CC = 2.5V ± 5% ; T_A = -40^ C to +85^ C , unless otherwise stated.
| Parameter Symbol | Min. Typ. | Max. Units | Condition | |||
| Input High Voltage V | IH | 2.0 — — | V — | |||
| Input Low Voltage V | IL | — | — | 0.8 | V | — |
| Input High Current | IH | -125 — | 30 μA — | |||
| Input Low Current | IL | -300 — | — μA — | — |
Note 1: The circuit is designed to meet the DC specifications shown in the above table after thermal equilibrium has been established.
AC ELECTRICAL CHARACTERISTICS (Note 1)
Electrical Characteristics: V_CC = 2.5V ± 5% , R_L = 100 across the outputs, Input t_f/t_f ≤ 300 ps; T_A = -40^ to +85^ , unless otherwise stated.
| Parameter | Symbol | Min. | Typ. | Max. | Units | Condition |
| Maximum Operating Frequency | f_MAX | 1.5 | 2.0 | — | GHz | V_OUT ≥ 200 mV, V_IN ≥ 200 mV |
| 1.0 | 1.5 | — | V_OUT ≥ 200 mV, V_IN ≥ 100 mV | |||
| Differential Propagation Delay IN-to-Q | t_pd | 600 | 820 | 1100 | ps | Note 2, 100 mV < V_IN ≤ 200 mV |
| Differential Propagation Delay IN-to-Q | 500 | 720 | 1000 | Note 2, IN-to-Q, 200 mV < V_IN ≤ 800 mV | ||
| Differential Propagation Delay SEL-to-Q | 400 | 600 | 800 | V_TH=V_CC/2 | ||
| Set-Up Time OE-to-IN | t_S | 300 | — | — | ps | Note 3 |
| Hold Time IN-to-OE | t_H | 800 | — | — | ps | Note 3 |
| Differential Propagation Delay Temperature Coefficient | t_pd tempco | — | 256 | — | fs/°C | — |
| Output-to-Output Skew | t_SKEW | — | 5 | 20 | ps | Note 4 |
| Input-to-Input Skew | — | 5 | 15 | Note 5 | ||
| Part-to-Part Skew | — | — | 300 | Note 6 | ||
| Clock Random Jitter | t_JITTER | — | — | 1 | ps_RMS | Note 7 |
| Cycle-to-Cycle Jitter | — | — | 1 | ps_RMS | Note 8 | |
| Total Jitter | — | — | 10 | ps_PP | Note 9 | |
| Crosstalk-Induced Jitter | — | — | 0.7 | ps_RMS | Note 10 |
AC ELECTRICAL CHARACTERISTICS (CONTINUED) (Note 1)
Electrical Characteristics: V_CC = 2.5V ± 5% , R_L = 100 across the outputs, Input t_r/t_f ≤ 300 ps; T_A = -40^ to +85^ , unless otherwise stated.
| Parameter | Symbol | Min. | Typ. | Max. | Units | Condition |
| Output Rise/Fall Time (20% - 80%) | t_f/t_f | 70 120 | 210 ps | At full output swing. | ||
| Duty Cycle — | 47 — | 53 | % | V_IN >200 mV | ||
| 45 — | 55 100 mV ≤ V | _IN ≤ 200 mV | ||||
Note 1: High-frequency AC parameters are guaranteed by design and characterization.
2: Propagation delay is measured with input t_r , t_f ≤ 300 ps (20% to 80%). The propagation delay is a function of the rise and fall times at IN. See Typical Performance Curves for details. t_pd varies with input t_r/t_f .
3: Set-up and hold times apply to synchronous applications that intend to enable/disable before the next clock cycle. For asynchronous applications, set-up and hold do not apply.
4: Output-to-Output skew is measured between two different outputs under identical transitions.
5: Input-to-Input skew is the time difference between the two inputs to one output, under identical input transitions.
6: Part-to-Part skew is defined for two parts with identical power supply voltages at the same temperature and with no skew of the edges at the respective inputs.
7: Random Jitter is measured with a K28.7 character pattern, measured at <f_MAX .
8: Cycle-to-Cycle Jitter definition: the variation of periods between adjacent cycles, T_n - T_n-1 where T is the time between rising edges of the output signal.
9: Total Jitter definition: with an ideal clock input of frequency <f_MAX no more than one output edge in 10^12 output edges will deviate by more than the specified peak-to-peak jitter value.
10: Crosstalk is measured at the output while applying two similar differential clock frequencies that are asynchronous with respect to each other at the inputs.
TEMPERATURE SPECIFICATIONS
| Parameters | Sym. | Min. | Typ. | Max. | Units | Conditions |
| Temperature Ranges | ||||||
| Operating Ambient Temperature Range | T_A | -40 — | +85 °C | — | ||
| Maximum Operating Junction Temperature | T_J | — | — | +125 | °C | — |
| Lead Temperature | — | — | — | +260 | °C | Soldering, 20 sec. |
| Storage Temperature Range | T_S | -65 — | +150 °C | — | ||
| Package Thermal Resistances (Note 1) | ||||||
| Thermal Resistance, 5x5 QFN-32Ld | _JA | — | 50 | — | °C/W | Still-air |
| _JB | — | 31 | — | °C/W | Junction-to-board | |
Note 1: Package thermal resistance assumes exposed pad is soldered (or equivalent) to the device's most negative potential on the PCB. _JB and _JA values are determined for a 4-layer board in still-air number, unless otherwise stated.
2.0 TYPICAL PERFORMANCE CURVES
Note: The graphs and tables provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
V_CC = 2.5V , GND = 0V, t_f/t_f ≤ 300 ps, V_IN = 100 mV, R_L = 100 across the outputs, T_A = +25^ C , unless otherwise stated.

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| Frequency (MHz) | Output Swing (mV) | | --------------- | ----------------- | | 0 | 310 | | 500 | 305 | | 1000 | 285 | | 1500 | 260 | | 1700 | 245 |FIGURE 2-1: Frequency Response.

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| Input Rise/Fall Time (ps) | Propagation Delay (ps) | | ------------------------- | ---------------------- | | 0 | 690 | | 200 | 700 | | 400 | 730 | | 600 | 770 | | 800 | 820 | | 1000 | 890 |FIGURE 2-4: Propagation Delay vs. Input Rise/Fall Time.

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| Input Rise/Fall Time (ps) | Propagation Delay (ps) | | ------------------------- | ---------------------- | | 0 | 890 | | 200 | 900 | | 400 | 930 | | 600 | 970 | | 800 | 1010 | | 1000 | 1050 |FIGURE 2-2: Propagation Delay vs. Input Rise/Fall Time.

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| Input Rise/Fall Time (ps) | Propagation Delay (ps) | | ------------------------- | ---------------------- | | 0 | 705 | | 200 | 715 | | 400 | 725 | | 600 | 735 | | 800 | 745 | | 1000 | 755 | | 1200 | 765 |FIGURE 2-5: Propagation Delay vs. Input Rise/Fall Time.

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| Input Rise/Fall Time (ps) | Propagation Delay (ps) | | ------------------------- | ---------------------- | | 0 | 820 | | 200 | 830 | | 400 | 850 | | 600 | 870 | | 800 | 890 | | 1000 | 910 |FIGURE 2-3: Propagation Delay vs. Input Rise/Fall Time.
V_CC = 2.5V , GND = 0V, V_IN = 250 mV, R_L = 100 across the outputs, T_A = +25^ , unless otherwise stated.

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| Time (600ps/div.) | Output Swing (100mV/div.) | | ----------------- | -------------------------- | | 0 | 20.0 |FIGURE 2-6: 200 MHz Clock.

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| TIME (100ps/div.) | Output Swing (100mV/div.) | | ----------------- | ------------------------- | | 0 | 60.0 % | | 1 | 20.0 % |FIGURE 2-9: 1.5 GHz Clock.

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| TIME (300ps/div.) | Output Swing (100mV/div.) | | ----------------- | -------------------------- | | 0 | 20.0 | | 50 | 20.0 | | 100 | 20.0 | | 150 | 20.0 | | 200 | 20.0 | | 250 | 20.0 | | 300 | 20.0 |FIGURE 2-7: 500 MHz Clock.

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| TIME (150ps/div.) | Output Swing (100mV/div.) | | ----------------- | ------------------------- | | 0 | 30.0 | | 150 | 20.0 |FIGURE 2-8: 1 GHz Clock.
3.0 ADDITIVE PHASE NOISE PLOT
Additive jitter is defined as the RMS Jitter of the device added to the input signal and is calculated in Equation 3-1.
EQUATION 3-1:
DeviceAdditiveJitter OutputRMSJitter ^2 -InputRMSJitter ^2

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| Frequency | Value | | --------- | --------- | | 100 Hz | -114.2377 | | 1 kHz | -127.5466 | | 10 kHz | -140.3083 | | 100 kHz | -140.7663 | | 1 MHz | -144.6529 | | 5 MHz | -144.9383 | | 10 MHz | -144.9310 | | 20 MHz | -144.9979 | | Start | 12 kHz | | Stop | 20 MHz | | Center | 10.006 MHz | | Span | 19.988 MHz | | Analysis Range X: Band Marker; Analysis Range Y: Band Marker; Intg Noise: -71.7754 dBc / 19.69 MHz; RMS Noise: 364.539 μrad; RMS Jitter: 93.239 fsec; Residual FM: 4.04961 kHzFIGURE 3-1: Integrated Phase Noise Plot of SY89847U (Device) and the Source (Input Signal).
From the plot shown in Figure 3-1, the device additive jitter can be calculated as follows.
EQUATION 3-2:
CalculatedAdditiveJitter93.23 ^2 -92384s=
4.0 PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 4-1.
TABLE 4-1: PIN FUNCTION TABLE
| Pin Number Symbol Description | ||
| 1, 8 VT0, VT1 | Input Termination Center-Tap: Each side of a differential input pair terminates to the VT pin. The VT pin provides a center-tap for each input (IN, /IN) to a termination network for maximum interface flexibility. See the Input Interface Applications section. | |
| 2, 36, 7 | IN0, /IN0IN1, /IN1 | Differential Inputs: These input pairs are the differential signal inputs to the device. These inputs accept AC- or DC-coupled signals as small as 100 mV. The input pairs internally terminate to a VT pin through 50Ω. Each input has level shifting resistors of 3.72 kΩ to VCC. This allows a wide input voltage range from VCC to GND. See Figure 5-8, Simplified Differential Input Stage for details. Note that these inputs will default to a valid (either high or low) state if left open. See the Input Interface Applications section. |
| 10, 11, 30, 31 | GND, Exposed Pad | Ground. Exposed pad must be connected to a ground plane that is the same potential as the ground pins. |
| 4 | OE | Single-Ended Input: This TTL/CMOS input disables and enables the Q0-Q4 outputs. It is internally connected to a 25 kΩ pull-up resistor and will default to a logic high state if left open. When disabled, Q goes low and /Q goes high. OE being synchronous, outputs will be enabled/disabled following a rising and a falling edge of the input clock. V_TH = V_CC/2 . |
| 5 SEL | Single-Ended Input: This single-ended TTL/CMOS-compatible input selects the inputs to the multiplexer. Note that this input is internally connected to a 25 kΩ pull-up resistor and will default to logic high state if left open. V_TH = V_CC/2 . | |
| 9, 32 | VREF-AC1VREF-AC0 | Reference Voltage: These outputs bias to V_CC - 1.2V . They are used for AC-coupling inputs IN and /IN. Connect VREF-AC directly to the corresponding VT pin. Bypass with 0.01 μF low ESR capacitor to VCC. Due to limited drive capability, the VREF-AC pin is only intended to drive its respective VT pin. Maximum sink/source current is ±0.5 mA. See the Input Interface Applications section. |
| 12, 13, 16, 19, 22, 25, 28, 29 | VCC | Positive Power Supply: Bypass with 0.1 μF||0.01 μF low ESR capacitors as close to the VCC pins as possible. |
| 27, 2624, 2321, 2018, 1715, 14 | Q0, /Q0Q1, /Q1Q2, /Q2Q3, /Q3Q4, /Q4 | LVDS Differential Output Pairs: Differential copies of the selected input signal. The output swing is typically 325 mV. Used and unused outputs must be terminated with 100Ω across the pair (Q, /Q). These differential LVDS outputs are a logic function of the IN0, IN1, and SEL inputs. See Table 4-2. |
TABLE 4-2: TRUTH TABLE
| Inputs Outputs | ||||||
| I | N | 0 / | I | N | 0 | I |
| 0 | 1 | X | X | 0 | 0 | 1 |
| 1 | 0 | X | X | 0 | 1 | 0 |
| X | X | 0 | 1 | 1 | 0 | 1 |
| X | X | 1 | 0 | 1 | 1 | 0 |
N
5.0 FUNCTIONAL DESCRIPTION
5.1 Clock Select (SEL)
SEL is an asynchronous TTL/CMOS compatible input that selects one of the two input signals. Internal 25 kΩ pull-up resistor defaults the input to logic high if left open. Input switching threshold is V_CC/2 . Refer to Figure 5-1.
5.2 Output Enable (OE)
OE is a synchronous TTL/CMOS compatible input that enables/disables the outputs based on the input to this pin. The enable function is synchronous so that the clock outputs will be enabled or disabled following a rising and a falling edge of the input clock. Refer to Figure 5-2. Internal 25 kΩ pull-up resistor defaults the input to logic high if left open. Input switching threshold is V_CC/2 .
5.3 Fail-Safe Input (FSI)
The input includes a special fail-safe circuit to sense the amplitude of the input signal and to latch the outputs when there is no input signal present, or when the amplitude of the input signal drops sufficiently below 100 mV_PK(200 mV_PP) , typically 30 mV_PK . Refer to Figure 5-4.
5.4 Input Clock Failure Case
If the input clock fails to a floating, static, or extremely low signal swing such that the voltage swing across the input pair is significantly less than 100 mV, FSI function will eliminate a metastable condition and latch the outputs to the last valid state. No ringing and no undetermined state will occur at the output under these conditions. The output recovers to normal operation once the input signal returns to a valid state with a typical swing greater than 30 mV.
Note that the FSI function will not prevent duty cycle distortion in case of a slowly deteriorating (but still toggling) input signal. Due to the FSI function, the propagation delay will depend on rise and fall time of the input signal and on its amplitude. Refer to the Typical Performance Curves for detailed information.
Timing Diagrams

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SEL Vcc/2 Vcc/2 tpd tpd Q /QFIGURE 5-1: SEL-to-Q Delay.

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Disabled Enabled IN OE /Q QFIGURE 5-2: Enable Output Timing Diagram.

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/IN IN t_pd /Q Q V_IN t_pd V_OUTFIGURE 5-3: Propagation Delay.

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| Signal | Value | |--------|-------| | IN | Decaying input signal | | Q | Decaying input signal | | /Q | Decaying input signal | | FSI | FSI activated once input amplitude goes significantly below 100mV (typically 30mV) |FIGURE 5-4: Fail-Safe Feature.

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OE Vcc/2 Vcc/2 IN /tS tH /INFIGURE 5-5: Setup and Hold Time.
Single-Ended and Differential Swings

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V_IN, V_OUT 325mV (typ.)FIGURE 5-6: Single-Ended Voltage Swing.

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650mV (typ.) VDIFF_IN, VDIFF_OUTFIGURE 5-7: Differential Voltage Swing.
Input Stage

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VCC 1.86kΩ 1.86kΩ 1.86kΩ IN 50Ω VT 50Ω /IN GNDFIGURE 5-8: Simplified Differential Input Stage.
6.0 INPUT INTERFACE APPLICATIONS

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VCC LVPECL GND VCC 0.1μF 19Ω IN /IN VT NC VREF-AC SY89847UFIGURE 6-1: LVPECL Interface (DC-Coupled).

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VCC CML GND IN /IN VCC 0.1μF VT VREF-AC SY89847UFIGURE 6-4: CML Interface (AC-Coupled).

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VCC LVPECL 50Ω 50Ω GND GND VCC 0.1μF IN IN SY89847U VT VREF-ACFIGURE 6-2: LVPECL Interface (AC-Coupled).

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VCC LVDS IN /IN SY89847U GND NC□ VT NC□ VREF-ACFIGURE 6-5: LVDS Interface (DC-Coupled).

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VCC CML IN /IN SY89847U GND NC□ VT NC□ VREF-ACFIGURE 6-3: CML Interface (DC-Coupled).
7.0 LVDS OUTPUT INTERFACE APPLICATIONS
LVDS specifies a small swing of 325 mV, typical, on a nominal 1.2V common mode above ground. The common mode voltage has tight limits to permit large variations in the ground between and LVDS driver and receiver. Also, change in common mode voltage, as a function of data input, is kept to a minimum, to keep EMI low.

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100Ω VOUT VOH, VOL VOH, VOL GNDFIGURE 7-1: LVDS Differential Measurement.

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50Ω 50Ω VOCM ΔVOCM GNDFIGURE 7-2: LVDS Common Mode Measurement.
8.0 PACKAGING INFORMATION
8.1 Package Marking Information
32-Pin QFN*

XXXXXXXXX WWNNN XXX
Example

SY89847U 28892 USA
Legend: XX...X Product code or customer-specific information
Y Year code (last digit of calendar year)
YY Year code (last 2 digits of calendar year)
WW Week code (week of January 1 is week '01')
NNN Alphanumeric traceability code
ePb-free JEDEC ^® designator for Matte Tin (Sn)
This package is Pb-free. The Pb-free JEDEC designator (e3) can be found on the outer packaging for this package.
•, ▲, ▼ Pin one index is identified by a dot, delta up, or delta down (triangle mark).
Note: In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. Package may or may not include the corporate logo.
Underbar (_) and/or Overbar (−) symbol may not be to scale.
32-Lead 5 mm x 5 mm QFN Package Outline and Recommended Land Pattern
TITLE
32 LEAD QFN 5x5mm PACKAGE OUTLINE & RECOMMENDED LAND PATTERN
| DRAWING # | QFN55-32LD-PL-5 | UNIT | MM |
| LEAD FRAME | NiPdAu | LEAD FINISH | NiPdAu |

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PN 1 DOT BY MARKING 32 D 1 2 E eeeTOP VIEW

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D bbb ddd e 32 PIN #1 ID R0.20 E2 1 2 L D2BOTTOM VIEW
| DIMENSION IN mm | |||
| SYMBOL | MIN | NOM | MAX |
| A | 0.80 | 0.85 | 1.00 |
| A1 | 0.00 | 0.02 | 0.05 |
| A3 | 0.20 (REF) | ||
| D | 5.00 BSC | ||
| D2 | 3.00 | 3.10 | 3.20 |
| E | 5.00 BSC | ||
| E2 | 3.00 | 3.10 | 3.20 |
| L | 0.35 | 0.40 | 0.45 |

SIDE VIEW

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0.50±0.02 0.2±0.01 3.40±0.02 4.20±0.03 755 0.50 BSCRECOMMENDED LAND PATTERN NOTE 10.12
| b (mm) | ø (mm) | |||||
| N | MIN | NOM | MAX | MIN | NOM | MAX |
| 32 | 0.18 | 0.25 | 0.30 | 0.50 BSC | ||
| TOLERANCE OF FORM AND POSITION | |
| coa | 0.15 |
| bbb | 0.10 |
| ccc | 0.10 |
| ddd | 0.05 |
| eee | 0.08 |
NOTE:
-
REFER TO JEDEC STANDARD MO-220 VHHD-2.
-
DIMENSION "6" APPLIES TO METALIZED TERMINAL AND IS MEASURED
BETWEEN 0.15mm TO 0.30mm FROM THE TERMINAL TIP.
- "aaa" THE BILATERAL PROFILE TOLERANCE THAT CONTROLS THE POSITION OF THE PLASTIC BODY SIDES.
THE CENTERS OF THE PROFILE ZONES ARE DEFINED BY THE BASIC DIMENSIONS "D" AND "E".
- "bob" THE TOLERANCE THAT CONTROLS THE POSITION OF THE ENTIRE TERMINAL PATTERN WITH RESPECT TO DATUM'S A AND B. THE
CENTER OF THE TOL FRANCE ZONE OF EACH TERMINAL IS DEFINED BY THE BASIC DIMENSION "p" AS RELATED TO DATUM A AND B
S. 'eee' THE TOLERANCE LOCATED PARALLEL TO THE SEATING PLANE IN WHICH THE TOP SURFACE OF THE PACKAGE MUST BE LOCATED
A 'www' THE TOI FRANCE THAT CONTROLS THE POSITION OF THE TERMINALS TO EACH OTHER. THE CENTERS OF THE PROFILE ZONE ARE
DEFINED BY BASIC DIMENSION "e".
-
'pee' THE UNILATERAL TOLERANCE LOCATED ABOVE THE SEATING PLANE WHEREIN THE BOTTOM SURFACE OF THE TERMINALS MUST BE LOCATED.
-
THE TOLERANCE THAT CONTROLS THE POSITION OF THE EXPOSED METAL HEAT FEATURE. THE CENTER OF THE TOLERANCE ZONE WILL BE
THE DATUM'S DEFINED BY THE CENTERLINES OF THE PACKAGE BODY.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging.
NOTES:
APPENDIX A: REVISION HISTORY
Revision A (October 2018)
- Converted Micrel document SY89847U to Microchip data sheet template DS20006101A.
- Minor text changes throughout.
NOTES:
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, contact your local Microchip representative or sales office.

text_image
PART NO. X Device Input Voltage X Package Temperature Range -XX Tape and ReelDevice:
SY89847: 1.5 GHz Precision, LVDS 1:5 Fanout Buffer
with 2:1 MUX and Fail-Safe Input with Internal Termination
Input Voltage: U = 2.5V/3.3V
Package: M = 5 mm x 5 mm QFN-32
Temperature Range:
G = -40°C to 85°C (NiPdAu Lead-Free)
Special Processing:
TR = 1,000/Reel
Examples:
a) SY89847UMG: SY89847, 2.5V/3.3V Input
Voltage, 5 mm x 5 mm 32-Lead
QFN, -40^ to +85^
Temperature Range, 60/Tube
b) SY89847UMG-TR: SY89847, 2.5V/3.3V Input
Voltage, 5 mm x 5 mm 32-Lead
QFN, -40^ to +85^
Temperature Range, 1,000/Reel
Note 1: Tape and Reel identifier only appears in the
catalog part number description. This identifier is used for ordering purposes and is not printed on the device package. Check with your Microchip Sales Office for package availability with the Tape and Reel option.
NOTES:
Note the following details of the code protection feature on Microchip devices:
• Microchip products meet the specification contained in their particular Microchip Data Sheet.
- Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions.
- There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip's Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
• Microchip is willing to work with the customer who is concerned about the integrity of their code.
- Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as "unbreakable."
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip's code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer's risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights unless otherwise stated.
Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company's quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELQQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip's quality system for the design and manufacture of development systems is ISO 9001:2000 certified.
QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV = ISO/TS 16949=
Trademarks
The Microchip name and logo, the Microchip logo, AnyRate, AVR, AVR logo, AVR Freaks, BitCloud, chipKIT, chipKIT logo, CryptoMemory, CryptoRF, dsPIC, FlashFlex, flexPWR, Heldo, JukeBlox, KeeLoq, Kleer, LANCheck, LINK MD, maXStylus, maXTouch, MediaLB, megaAVR, MOST, MOST logo, MPLAB, OptoLyzer, PIC, picoPower, PICSTART, PIC32 logo, Prochip Designer, QTouch, SAM-BA, SpyNIC, SST, SST Logo, SuperFlash, tinyAVR, UNI/O, and XMEGA are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.
ClockWorks, The Embedded Control Solutions Company, EtherSynch, Hyper Speed Control, HyperLight Load, IntelliMOS, mTouch, Precision Edge, and Quiet-Wire are registered trademarks of Microchip Technology Incorporated in the U.S.A.
Adjacent Key Suppression, AKS, Analog-for-the-Digital Age, Any Capacitor, AnyIn, AnyOut, BodyCom, CodeGuard, CryptoAuthentication, CryptoAutomotive, CryptoCompanion, CryptoController, dsPICDEM, dsPICDEM.net, Dynamic Average Matching, DAM, ECAN, EtherGREEN, In-Circuit Serial Programming, ICSP, INICnet, Inter-Chip Connectivity, JitterBlocker, KleerNet, KleerNet logo, memBrain, Mindi, MiWi, motorBench, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, MultiTRAK, NetDetach, Omniscient Code Generation, PICDEM, PICDEM.net, PICkit, PICtail, PowerSmart, PureSilicon QMatrix, REAL ICE, Ripple Blocker, SAM-ICE, Serial Quad I/O, SMART-I.S., SQI, SuperSwitcher, SuperSwitcher II, Total Endurance, TSHARC, USBCheck, VariSense, ViewSpan, WiperLock, Wireless DNA, and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.
SQTP is a service mark of Microchip Technology Incorporated in the U.S.A.
Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries.
GestIC is a registered trademark of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries.
All other trademarks mentioned herein are property of their respective companies.
© 2018, Microchip Technology Incorporated, All Rights Reserved. ISBN: 978-1-5224-3837-3
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